Tc -mapping and investigation of water degradation of YBaCuO thin films by Low Temperature Scanning Electron Microscopy
M. E. Gaevski, A. V. Bobyl, S. G. Konnikov, D.V. Shantsev, V. A. Solov'ev, R. A. Suris
Scanning Microscopy, v.10 (3), pp.679-695 (1996).

The Tc -mapping method using low temperature scanning electron microscopy (LTSEM) has been developed to study the spatial distribution of the critical temperature in HTSC films with a spatial resolution approaching 2 microns. To achieve so high a spatial resolution, a numerical deconvolution method was applied that eliminated distorting effects associated with the thermal diffusion and with the contribution from the absorbed beam current. The Tc-mapping method was used to investigate modification by water of YBa2Cu3O7 films grown on (100) MgO and (110) LaAlO3 substrates. The rate of modification of a [110]-oriented YBa2Cu3O7/LaAlO3 film is found to be 40 times that of a c-axis oriented YBa2Cu3O7/MgO epitaxial film. It is argued that water-initiated modification of the films results from penetration of hydrogen into the films, rather than from outdiffusion of oxygen.