Remarks | Referens | ||
Bulk modulus | 20.4 x 1011 dyn cm-2 | Bougrov et al. (2001) | |
Debye temperature | 600 K | ||
Melting point, Tm | 2500° C | also see: Equilibrium N2 pressure over GaN. |
Porowski (1997) |
Specific heat | 0.49 J g-1°C -1 | Bougrov et al. (2001) | |
Thermal conductivity | 1.3 W cm-1 °C -1 |
also see Fig: Thermal conductivity. | Sichel & Pankove (1977) ; Chow & Ghezzo (1996) |
Thermal diffusivity |
0.43 cm2 s-1 | Bougrov et al. (2001) | |
Thermal expansion coefficient, linear | αort= αc = 3.17x10-6 K-1 | (Wurtzite structure) | Qian et al. (1996) |
α||= αa =5.59x10-6 K-1 |
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GaN, Wurtzite sructure. Thermal conductivity along the c-axis
vs. temperature Sichel & Pankove (1977). |
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GaN,Wurtzite sructure. The calculated (solid line) and measured
(open circles) specific heat vs. temperature. Nipko et al. (1998). Experimental points are taken from Barin et al. (1977). |
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GaN, Wurtzite sructure. Lattice parameters a and c
vs. temperature for a single crystal layer. Maruska & Tietjen (1969). |
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GaN,Wurtzite sructure. The lattice constants a vs. temperature. Leszczynski et al. (1994) |
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GaN,Wurtzite sructure. The lattice constants c vs. temperature. Leszczynski et al. (1994) |
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GaN, Wurtzite sructure. Coefficient of linear thermal expansion vs.
temperature. curve 1 - α ![]() curve 2 - α|| . Sheleg & Savastenko (1976). |
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GaN. The temperature dependences of the parallel lattice mismatch
between GaN layer and sapphire substrate . Leszczynski et al. (1994) |
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GaN. Equilibrium N2 pressure over GaN. Dashed lines indicate the maximum pressure and temperarure available in the experimental system. Porowski (1997) |